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Journal Articles

Plasma-mirror frequency-resolved optical gating for simultaneous retrieval of a chirped vacuum-ultraviolet waveform and time-dependent reflectivity

Itakura, Ryuji*; Kumada, Takayuki; Nakano, Motoyoshi*; Akagi, Hiroshi*

High Power Laser Science and Engineering, 4, p.e18_1 - e18_5, 2016/06

 Times Cited Count:4 Percentile:25.35(Optics)

We demonstrate that the methodology of frequency-resolved optical gating (FROG) is applicable to time-resolved reflection spectroscopy of a plasma mirror in the vacuum-ultraviolet (VUV) region. Our recent study has shown that a VUV waveform can be retrieved from a VUV reflection spectrogram of a plasma mirror formed on a fused silica (FS) surface by irradiation with an intense femtosecond laser pulse. Simultaneously, the increase in the reflectivity with respect to the Fresnel reflection of the unexcited FS surface can be obtained as a time-dependent reflectivity of the plasma mirror. In this study, we update the FROG analysis procedure using the least-square generalized projections algorithm. This procedure can reach convergence much faster than the previous one and has no aliasing problem. It is demonstrated that a significantly chirped VUV pulse as long as 1 ps can be precisely characterized.

Journal Articles

Using LiF crystals for high-performance neutron imaging with micron-scale resolution

Faenov, A.*; Matsubayashi, Masahito; Pikuz, T.*; Fukuda, Yuji; Kando, Masaki; Yasuda, Ryo; Iikura, Hiroshi; Nojima, Takehiro; Sakai, Takuro; Shiozawa, Masahiro*; et al.

High Power Laser Science and Engineering, 3, p.e27_1 - e27_9, 2015/10

 Times Cited Count:10 Percentile:49.69(Optics)

Journal Articles

Stabilization of a high-order harmonic generation seeded extreme ultraviolet free electron laser by time-synchronization control with electro-optic sampling

Tomizawa, Hiromitsu*; Sato, Takahiro*; Ogawa, Kanade*; Togawa, Kazuaki*; Tanaka, Takatsugu*; Hara, Toru*; Yabashi, Makina*; Tanaka, Hitoshi*; Ishikawa, Tetsuya*; Togashi, Tadashi*; et al.

High Power Laser Science and Engineering, 3, p.e14_1 - e14_10, 2015/04

 Times Cited Count:6 Percentile:34.43(Optics)

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